A Model Equipped with a 405 nm Laser and Possible to Perform 3D Geometric Observation/Measurement and Surface Roughness Measurement in a Micro Range at High Resolution
This model is equipped with a newly-developed dual confocal system that enables measurement of samples conventionally difficult to be measured. The LEXT OLS4000 has enhanced the surface roughness measurement function and achieved output results with the same operability and compatibility as those of a contact surface-roughness measuring machine, while making the most of the non-contact benefits.
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Imaging Slopes Up to 85 Degrees
Thanks to dedicated objective lenses with high numerical apertures and a dedicated optical system that obtains maximum performance from the 405 nm laser, the LEXT OLS4000 can reliably measure acute-angled specimens that were previously impossible to measure.
Razor with acute angle
LEXT Special design objective lens
Overcoming Reflectance Differences
The LEXT OLS4000 employs a newly developed dual confocal system. Thanks to the integration of two confocal optical systems, the LEXT OLS4000 can capture a clear image from a specimen consisting of materials with different reflectance characteristics.
Specimen with Diverse Reflectance (Diamond-electrodeposited Tool)
Dual Confocal system
Minimize influence from Measurement Environments
To eliminate external influences on measurement and from measurement environment, the LEXT OLS4000 incorporates a hybrid vibration-damping mechanism using coil springs and damping rubber. This eliminates the need for a dedicated vibration-damping stand, allowing measurements on any desktop.
Hybrid Vibration-damping Mechanism
Reduced Vibration Influence with the Vibration Isolation Mechanism
World's First Double Performance Guarantees
The performance of a measuring tool or its accuracy is expressed in two different terms. One is "Accuracy", which indicates how close a measurement value is to the true value, and the other is "Repeatability", which indicates the degree of variations among repeated measurement values. The LEXT OLS4000 assures both accuracy and repeatability - a world's first for laser microscopes.
Two Performance Guarantees
The LEXT OLS4000 uses a rigorous system of production for every component from the objective lens to the laser head, Olympus delivers only the highest quality systems to customers after thorough inspection based on stringent standards. Final adjustment and calibration is performed at delivery by qualified engineers in the actual measurement environment.
Reproducing More Realistic Images of Micro Asperities
Differential Interference Contrast (DIC) is an observation method for visualizing sub-nanometer micro asperities,which are far beyond the resolving power of a laser microscope. This DIC allows you to obtain live images comparable to those of an electron microscope under relatively low power magnifications.
Laser Confocal with DIC (Polymer Film)
Laser Confocal (Polymer Film)
Supporting Wide-field Observation
A higher-magnification image generally narrows the visual field range. The stitching function enables you to stitch up to 500 images together to create high-resolution, wide-field image data. Additionally, 3D display and 3D measurement are possible even for this wide-field image.
Brightness of Image After Stitching still even and clear
Stitched 3D Image
Customizable ID Control and Security Enhancement
Operators can log in to the LEXT OLS4000 using individualized IDs to customize the image database and operating environment. Each ID is displayed on every report and specimen image, giving the administrator an at-a-glance picture of when each report was created or each image was captured and who created each report or captured each image.
Login GUI
Wizard Function that Gives Novice Operators a Sense of Security
For quick and easy operation by new operators, the LEXT OLS4000 has a detailed user designed wizard function. This wizard function eliminates the time spent on reading the manual and lengthy training.
Wizard Frame Function
Macro Map that Doesn't Get Lost for Observation
Since the visual field is narrowed during observation under high magnification, in many circumstances the operator can lose track of the location of the specimen. The LEXT OLS4000 is equipped with the macro map function. The screen always displays a wide-field image of the specimen under low magnification, displaying a rectangular observation marker on the macro specimen image.
Macro Map Function
Motorized Revolving Nosepiece to Prevent Specimen Contact and Automatically Adjust Illumination for Optimized Imaging
The LEXT OLS4000 is equipped with a motorized revolving nosepiece as standard to prevent contact with a specimen during objective lens change. When a new lens is selected, the revolving nosepiece automatically retracts to avoid contacting the specimen. At the same time, the revolving nosepiece automatically brings the objective lens into focus along with image alignment and adjusts light intensity, allowing stress-free switchover of magnifications.
Motorized Revolving Nosepiece
Intelligent Noise Removal (INR) Algorithm Allows Even First-time Users to Easily Visualize an Image Comparable to a Skilled Operator's
For optimal operation, Olympus has successfully preset a skilled operator's criteria in the system based on experience accumulated over Olympus's 90 year history. Much of this is attributable to the INR (Intelligent Noise Reduction) algorithm newly installed on the LEXT OLS4000. This algorithm allows even a new operator to easily obtain an image identical to that of a expert.
INR Algorithm Installed / Not Installed
Speedy Generation of Easy-to-understand Reports
Fast production of easy-to-understand reports is vital to a laser microscope. The LEXT OLS4000 generates a report with one click. It is also provided with an edit function to allow the operator to customize each template. It is also provided with an edit function to allow the operator to customize each template.
Completed Report Form / Customized
New "Roughness Measurement" Capabilities Open New Possibilities in Measurement
The LEXT OLS4000 has been developed to represent a new standard of surface roughness measuring tool. This system is calibrated in the same way contact surface roughness gauges are calibrated, and has the necessary roughness parameters and filters required per ISO and JQA. This allows users with contact surface roughness gauges to obtain output results from the system consistent with their existing instruments, with the advantage of greater speed and noncontact measurement. The LEXT OLS4000 has a new roughness-specific mode enabling roughness profile measurement for sample lengths up to 100 mm with the new automatic line stitching function.
Roughness Measurement GUI
Measurement Profile Comparison between OLS4000 and Contact Surface Roughness Gage (Total profile length: 1.6 mm)
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| Primary Profile from LEXT OLS4000 λs=2.5 µm without Filtering |
Primary Profile from LEXT OLS4000 λs=2.5 µm with Filtering |
Primary Profile from a Contact Surface Roughness Measuring Machine |
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Parameters List
LEXT OLS4000 Surface Profile Parameters List
LEXT OLS4000 Surface Roughness Parameters List
(Conforms to ISO25178 Draft)
Micro Roughness
Contact surface roughness measuring machines cannot measure micro asperities less than the stylus tip diameter. The laser microscope can measure the surface roughness of micro geometries at high resolution due to a minute laser spot diameter.
Contact Surface Roughness Measuring Machine
Laser Microscope
Non-Contact
Since a contact surface roughness measuring machine uses a hard needle-shape stylus, it is more likely to scratch the surface of a soft specimen, damaging or deforming it. With adhesive specimens, on the other hand, the stylus could attach to the specimen and be damaged when pulled loose, making it impossible to obtain correct results. Laser microscopes, which are of a non-contact type, can perform accurate surface roughness measurement regardless of surface texture conditions.
Soft Specimen
Adhesive Specimen
Measurement of Micro Areas
Surface roughness measuring machines cannot measure micro areas since their stylus are not able to access these areas. Laser microscopes can correctly identify a measuring position and easily perform roughness measurement of a target micro area.
Bonding Wires
3D Measuring Laser Microscope LEXT OLS4000 Specifications
| Optical System | UIS2 Optical System (Infinity-corrected) | |||
|---|---|---|---|---|
| Total Magnification | 108x - 17280x | |||
| Field of View | 2560x2560 - 16x16 µm | |||
| Microscope Frame | Observation Method | BF/DIC/Laser/Laser Confocal DIC | ||
| Laser | 405 nm Semiconductor Laser | |||
| White Light | White LED | |||
| Focus | Z Stage | Stroke | 100 mm | |
| Maximum Height of Specimen | 100 mm | |||
| Z Revolving Nosepiece | Stroke | 10 mm | ||
| Resolution | 0.01 µm | |||
| Repeatability | σn-1=0.012 µm | |||
| Objective Lens | 5x, 10x, 20x, 50x, 100x | |||
| Optical Zoom | 1x - 8x | |||
| Stage | Motorized Stage | 100x100 mm | ||
| Dimensions | 276(W)x358(D)x405(H) mm | |||
| Weight | 32 kg (Main Unit) | |||