| Clutch type large stage allows
quick inspection of large areas
The STM6-LM's stage provides a large
measuring area of 250x150mm. All X and Y movements are clutch-controlled,
and quick exchange of the axis is performed by simply moving a lever.
Free movements on the X/Y-axis and XY plane allow even large specimens
to be quickly and accurately inspected.
Highly advanced UIS optics for edge detection
and outside inspection
Clear edge detection, which is indispensable for accurate measuring, is
ensured by the superb resolution and high contrast of advanced UIS optics.
The result is greatly improved inspection in measurement and also outer
inspection.
High magnification measurement and Nomarski
DIC observation
Three different types of incident light illumination units are provided
to meet requirements right across the measurement range. Correspond to
measurement objectives and metallurgical objectives using revolving nosepiece,
brightfield, darkfield and Nomarski DIC observations are possible. The
system can be freely upgraded by adding units according to need.
Superior footprint body with integrated electric
apparatus
Integration of the counter and electric apparatus is yet another feature
of this microscope's easy-to-use, space-saving design. The counter is
positioned at eye level, allowing the operator to confirm the readout
with a simple lateral eye movement. Readouts in 0.1 and 0.5µm gradations
are both available and can be selected at the time of purchase. ŒA standard
RS232C data communication interface is provided for easy transfer of data
to a personal computer: data stored in this way can be used as a database
using such software as Microsoft Excel. |