Top of the range X-MET5100 combines Oxford Instruments’ groundbreaking Silicon Drift Detector (SDD) with a powerful 45kV X-ray tube. This cutting edge technology delivers a five times faster measurement speed, much better detection limits and a significant accuracy improvement over conventional systems.
X-MET5100's new technology combined with traceable Empirical Calibration enables accurate analysis:
- metal testing in seconds and light elements such as Mg, Al and Si without the need for inconvenient vacuum or helium attachments
- restricted elements for compliance screening
- lead, cadmium and other heavy metals in toys and consumer products
- soil contaminants at low ppm levels
- key elements in mineral & ores at speeds previously not possible